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JEOL TEM-F200

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⚙️Technical Specifications

The JEOL JEM-F200 is a high-performance transmission electron microscope designed for advanced imaging and analysis at the atomic scale. It supports multiple analytical techniques, including EDS, EELS, tomography, and high-resolution STEM/TEM imaging.

Acceleration voltage

20 – 200 kV

Resolution (TEM mode)

≤ 0.10 nm (Cold FEG)

Resolution (STEM mode)

≤ 0.14 nm

Electron source

Cold FEG / Schottky FEG

Imaging modes

TEM, STEM, SAED, HRTEM, tomography

Detectors

EDS, EELS, BF/DF detectors

Tilt holders

±35° (standard), ±80° (tomography)

🧪 Applications

Atomic-scale imaging of nanomaterials

Crystallography and phase identification

Defect and dislocation analysis

Elemental mapping (EDS)

3D reconstruction (electron tomography)

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This instrument is available to internal and external researchers.

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