


See the JEOL TEM-F200 in action
click here !⚙️Technical Specifications
The JEOL JEM-F200 is a high-performance transmission electron microscope designed for advanced imaging and analysis at the atomic scale. It supports multiple analytical techniques, including EDS, EELS, tomography, and high-resolution STEM/TEM imaging.
Acceleration voltage
20 – 200 kV
Resolution (TEM mode)
≤ 0.10 nm (Cold FEG)
Resolution (STEM mode)
≤ 0.14 nm
Electron source
Cold FEG / Schottky FEG
Imaging modes
TEM, STEM, SAED, HRTEM, tomography
Detectors
EDS, EELS, BF/DF detectors
Tilt holders
±35° (standard), ±80° (tomography)