MX-Lab DED System

⚙️Technical Specifications

The JEOL JIB-PS500i is an advanced focused ion beam-scanning electron microscope (FIB-SEM) designed for precision nanomachining, imaging, and analytical workflows.

Deposition method

Directed Energy Deposition (DED)

Powder feeders

6 independent feeders

Materials

Metals, alloys, custom blends

Laser power

Adjustable fiber laser

Build volume

Custom, lab-scale

🧪 Applications

Functionally graded materials

Alloy design and prototyping

Additive repair and coatings

Join us!

This instrument is available to internal and external researchers.