⚙️Technical Specifications
The JEOL JIB-PS500i is an advanced focused ion beam-scanning electron microscope (FIB-SEM) designed for precision nanomachining, imaging, and analytical workflows.
Magnification
13x – 8220x
Imaging modes
Brightfield, Darkfield, MIX
Z-stack imaging
Yes (3D profiles & height)
Resolution
High-resolution CCD sensor
Stage
Motorized XY, tilt stage