sem-hitachi-su70 – NanoView

⚙️Technical Specifications

The Hitachi SU70 is a field emission scanning electron microscope (FEG-SEM) offering ultra-high resolution surface imaging, ideal for fine topographical and morphological analysis.

Acceleration voltage

20 – 200 kV

Resolution (TEM mode)

≤ 0.10 nm (Cold FEG)

Resolution (STEM mode)

≤ 0.14 nm

Electron source

Cold FEG / Schottky FEG

Imaging modes

TEM, STEM, SAED, HRTEM, tomography

A few things we’re great at

Atomic-scale imaging of nanomaterials

Crystallography and phase identification

Defect and dislocation analysis

Elemental mapping (EDS)

3D reconstruction (electron tomography)

Join us!

This instrument is available to internal and external researchers.