JEOL JIB-PS500i
Dual-beam FIB-SEM system enabling nanomachining and high-resolution analysis with EDS/EBSD.
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FEG-SEM Hitachi SU70
High-resolution field emission SEM, ideal for surface topography and fine structural analysis.
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Versatile FIB-SEM system combining SEM imaging with precise ion milling and 3D reconstruction.
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